Secondary Ion Mass Spectroscopy of Zinc Selenide Crystals with Photoconductivity Spectral Memory

dc.contributor.author	Ковальов, Леонід Євгенійович
dc.date.accessioned	2017-02-15T13:32:55Z
dc.date.accessioned	2026-11-02T14:27:11Z
dc.date.available	2017-02-15T13:32:55Z
dc.date.issued	2017
dc.description.abstract	The main aim of this work was to study the composition of impurities in high-resistivity ZnSe samples possessing the phenomenon of spectral memory of the photoconductivity in order to detect traces of iron impurities by the method of secondary ion mass spectroscopy (SIMS).	uk_UA
dc.identifier.citation	Belenchuk, A.V., Ilyinykh, N.I. & Kovalev, L.E. Secondary Ion Mass Spectroscopy of Zinc Selenide Crystals with Photoconductivity Spectral Memory. Russ. Phys. J., Vol. 59, No. 10, 1718-1720 (2017)	uk_UA
dc.identifier.issn	1064-8887; 1573-9228
dc.identifier.uri	https://dspace.unu.edu.ua/handle/123456789/6557
dc.language.iso	en	uk_UA
dc.publisher	Springer US	uk_UA
dc.subject	zinc selenide	uk_UA
dc.subject	photoconductivity	uk_UA
dc.subject	mass spectroscopy	uk_UA
dc.title	Secondary Ion Mass Spectroscopy of Zinc Selenide Crystals with Photoconductivity Spectral Memory	uk_UA
dc.type	Стаття	uk_UA
old.handle	123456789/5209
old.id	3a0c1e67-d731-4cdd-bdd1-710fdcdabf89
old.sourceSite	lib.udau.edu.ua

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